Terahertz for Material Characterization
Our material characterization capabilities open up new opportunities for solid-state physics research and testing
Terahertz technology is the next significant diagnostic modality for performing rapid and non-destructive analysis.
The high frequency dependent complex conductivity of materials can be obtained from non-contact THz spectroscopy using TeraView's TPS Spectra 3000.
Material characterisation applications:
Improving the performance and quality of solid-state properties of and metamaterials.
Understanding carrier transport and dynamics of high-speed semiconductors devices.
TeraView's material characterization analysis can also assist in improving the quality and consistency of a wide range of products. The main benefits of our TPS Spectra 3000 system include:
Normal image of corn seed
Terahertz images of corn seed