Future Events
June 12 - 13, 2012, At Taylor and Monument St., Dayton, Ohio
Rob May will be talking on
"On-line terahertz sensors"
Date: Tuesday, June 12, 2012
Abstract: The commercialisation of terahertz technology that has occurred over the last decade has seen the emergence of reliable, turn-key terahertz systems that have made it possible to bring this technology out of the laboratory and into challenging industrial environments. The advantages offered by imaging and spectroscopy in this part of the electromagnetic spectrum, most notably that terahertz radiation penetrates most non-metallic materials in a non-contact, non-destructive and non-ionising manner, makes it ideal for the monitoring and control of a host of industrial processes. Here we discuss the development of and potential for real-time terahertz sensors with particular focus on two industrial applications developed by TeraView.
A relatively mature application area for terahertz is in the development and production of pharmaceutical tablets. In the laboratory, during tablet development, terahertz imaging has become an invaluable tool for the evaluation of functional film coatings on pharmaceutical tablets: i.e. for evaluation of coating quality, thickness, interaction with the core as well as for detection of agglomerates and cracks inside the tablet core. Recent research in this area has culminated in the development of an in-line/on-line sensor to continuously monitor coated film thickness. In contrast to the standard weight gain method of monitoring tablet coating, the in-line terahertz sensor measures actual coating thickness continuously over the full duration of the coating process. Not only would such an instrument provide greatly improved process control but also the process understanding needed to develop advanced functional coats.
The technique of coating thickness evaluation developed for the pharmaceutical industry can similarly be applied to many other coating processes provided a sufficient refractive index difference exists across the layer boundary. Recently, investigations have been made by TeraView to measure the thickness of multiple paint layers on automobiles. Current measurement techniques are limited to at-line, point measurements that require contact with the painted chassis, whereas terahertz has the potential to provide real-time monitoring of the paint process in the automotive and other industries employing thin painted layers.
TERA-2012, 2-nd International Conference
June 20 - 22, 2012; Moscow, Russia
Contact Philip F. Taday, TeraView Ltd. (United Kingdom) at TeraView's stand
Past Events
THE DETROIT SOCIETY FOR COATINGS TECHNOLOGY
37th Annual Focus Conference
Date: Thursday, May 3, 2012
At the MSU MANAGEMENT EDUCATION CENTER, TROY, MI
David Reece will be talking on
"Terahertz Light for Measuring Coating Thickness and Paint Defects"
Abstract: Terahertz light lies between infrared and microwaves. TeraView has been developing terahertz technology and applications for over 10 years in several industries. Rapid, non-destructive and non-contact, low power terahertz light pulses can accurately measure individual layer thickness of a multiple layer paint coating and can be used to rapidly scan large areas with multiple readings. This can enable 100% quality inspection of multiple panels and also be used as a diagnostic tool for defects and process development. This talk will discuss advances in the use of terahertz light from the research arena towards real world applications in industry. Demonstrating work initially developed for measuring pharmaceutical tablet coatings, applications within automotive and industrial paint and coating applications will be discussed.
To arrange a meeting with the speaker please contact David Reece, TeraView Ltd. (United Kingdom)
International Forum on Terahertz Spectroscopy and Imaging
Date: 6 - 7 March 2012
Fraunhofer-Zentrum, Kaiserslautern (Germany)
Real-world applications of terahertz pulsed technology
Contact David Lowe, TeraView Ltd. (United Kingdom) at TeraView's stand
21 - 26 January 2012 The Moscone Center San Francisco, California, USA
Real-world applications of terahertz pulsed technology
Paper 8261-20 of Conference 8261
Date: Thursday, 26 January 2012
Author(s): Philip F. Taday, TeraView Ltd. (United Kingdom)
Abstract: Over the past twenty years terahertz sensor technology has been looking for a "killer" application since the first demonstration of free-space radiation following exposure of a GaAs co-planar strip line to an ultrafast pulsed laser. In the early years, research groups rapidly looked first at dental applications and then skin cancer; however these applications are driven by cost and regulation which make these areas difficult and expensive to penetrate. Early in this century, applications in non-destructive testing began to come to the forefront. This paper discusses the new exciting applications of terahertz pulsed technology in solving real world problems.
Also come and see us at Booth 4109 - North Hall Stand
if you would like to pre-arrange a meeting, please e-mail Phil Taday.
2011
The microelectronics FA event of the year is in San Jose, California, USA
Conference: November 13-17, 2011
Exposition: November 15-16, 2011
Come and see us at BOOTH 522
if you would like to pre-arrange a meeting, please e-mail Martin Igarashi.
July 20-22 2011, FAIRBORN CONFERENCE CENTER Holiday Inn, 2800 Presidential Dr., Fairborn, OH 45324
Ian Grundy, Teraview Ltd, UK
Plenary Title: "Pioneering Terahertz Technology and Applications"
The 2011 NAECON theme is "Intelligent Aerospace Sensor Integration". NAECON is a major forum for researchers, practitioners, and students interested in advanced aerospace sensors, imaging, RFIC design, collaboration, THz & signal processing, radar, cyber and nanodevices; then attend the Dayton Air Show starting July 23, featuring the United States Air Force Thunderbirds!
18th IEEE International Symposium on the physical and Failure Analysis of integrated circuits(IPFA)
4th - 7th July
Songdo Convensia, Incheon, Korea.
TeraView, working with Intel Corporation, has developed a next generation Terahertz (THz) Time Domain Reflectometry (TDR) type Failure Analysis (FA) tool to enable fast high resolution (sub 10 micron) fault isolation and analysis in advanced semiconductor packages (POP, flip Chip etc).
Please contact us if you would like to arrange a meeting at this conference
First terahertz (THz) workshop, 17th and 18th of May 2011, Dayton, Ohio - Philip Taday - organiser.
This workshop will be held at IDCAST and will aim at bringing together new and existing terahertz instrumentation users. It will be an opportunity to share knowledge and understating of the technology.
THz systems will be used for hands on demonstration of the equipment. Data processing and analysis techniques will be also extensively discussed.
If you are interested in participating, provide us with the information on this form.
For recommended hotels in Dayton follow the links: Crown Plaza Hotel, Courtyard by Marriott.
2011 SEMICON China
March 15 -17, 2011
Shanghai New International Expo Centre | Shanghai, China
Please contact Ian Grundy if you would like to arrange a meeting at this conference
EBEA2011, Rome, Italy
February 21 -24, 2011
Phil Taday, invited speaker, will be talking on the 23rd of February, at 14.30 at the Sapienza University of Rome, Engineering Faculty.
Application of terahertz waves: sources, biological effects and medical applications
Philip Taday, TeraView Limited
Date: February 23rd Time: 14:30 Location: Aula 1
22 - 27 January 2011 The Moscone Center San Francisco, California, USA
2010 MRS Fall Meeting
November 29-December 3, 2010
Hynes Convention Center | Sheraton Boston Hotel Boston, Massachusetts
Please visit us at the 2010 MRS Fall Meeting in Boston, Massachusets.
International Symposium for Testing and Failure Analysis (ISTFA)
14th - 18th November
TeraView, working with Intel Corporation, has developed a next generation Terahertz (THz) Time Domain Reflectometry (TDR) type Failure Analysis (FA) tool to enable fast high resolution (sub 10 micron) fault isolation and analysis in advanced semiconductor packages (POP, flip Chip etc).
Come and see us at Booth 207 to learn more!
ASNT 19th Annual Research Symposium & Spring Conference
22 - 26 March 2010
Dr Phil Taday, TeraView Ltd will be presenting at the conference
Applications of terahertz pulsed technology in non-destructive testing
DPG Spring Meeting
21- 26 March 2010
For more information on this event please click here.
