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Future Events



Photonics west

Photonics West conference

21 - 26 January 2012 The Moscone Center San Francisco, California, USA

Real-world applications of terahertz pulsed technology

Paper 8261-20 of Conference 8261

Date: Thursday, 26 January 2012

Author(s): Philip F. Taday, TeraView Ltd. (United Kingdom)

Abstract: Over the past twenty years terahertz sensor technology has been looking for a "killer" application since the first demonstration of free-space radiation following exposure of a GaAs co-planar strip line to an ultrafast pulsed laser. In the early years, research groups rapidly looked first at dental applications and then skin cancer; however these applications are driven by cost and regulation which make these areas difficult and expensive to penetrate. Early in this century, applications in non-destructive testing began to come to the forefront. This paper discusses the new exciting applications of terahertz pulsed technology in solving real world problems.

Also come and see us at Booth 4109 - North Hall Stand

if you would like to pre-arrange a meeting, please e-mail Phil Taday.


Past Events


ISTFA 2011

The microelectronics FA event of the year is in San Jose, California, USA

ISTFA Failure analysis conference

Conference: November 13-17, 2011 
Exposition: November 15-16, 2011

Come and see us at

BOOTH 522

if you would like to pre-arrange a meeting, please e-mail Martin Igarashi.


NAECON Ohio 2011

NAECON

July 20-22 2011, FAIRBORN CONFERENCE CENTER Holiday Inn, 2800 Presidential Dr., Fairborn, OH 45324

Ian Grundy, Teraview Ltd, UK 
Plenary Title: "Pioneering Terahertz Technology and Applications"

The 2011 NAECON theme is "Intelligent Aerospace Sensor Integration". NAECON is a major forum for researchers, practitioners, and students interested in advanced aerospace sensors, imaging, RFIC design, collaboration, THz & signal processing, radar, cyber and nanodevices; then attend the Dayton Air Show starting July 23, featuring the United States Air Force Thunderbirds!

 


 


18th IEEE International Symposium on the physical and Failure Analysis of integrated circuits(IPFA)
4th - 7th July
Songdo Convensia, Incheon, Korea.

TeraView, working with Intel Corporation, has developed a next generation Terahertz (THz) Time Domain Reflectometry (TDR) type Failure Analysis (FA) tool to enable fast high resolution (sub 10 micron) fault isolation and analysis in advanced semiconductor packages (POP, flip Chip etc).

Please contact us if you would like to arrange a meeting at this conference

First terahertz (THz) workshop, 17th and 18th of May 2011, Dayton, Ohio - Philip Taday -organiser.

This workshop will be held at IDCAST and will aim at bringing together new and existing terahertz instrumentation users. It will be an opportunity to share knowledge and understating of the technology.

THz systems will be used for hands on demonstration of the equipment.

Data processing and analysis techniques will be also extensively discussed.

 

If you are interested in participating, provide us with the information on this form.

For recommended hotels in Dayton follow the links: Crown Plaza Hotel, Courtyard by Marriott.

 


Semi Con China 2011
2011 SEMICON China
March 15 -17, 2011
Shanghai New International Expo Centre | Shanghai, China

Please contact Ian Grundy if you would like to arrange a meeting at this conference

 

 

EBEA2011

EBEA2011, Rome, Italy
February 21 -24, 2011

Phil Taday, invited speaker, will be talking on the 23rd of February, at 14.30 at the Sapienza University of Rome, Engineering Faculty.

philip TadayApplication of terahertz waves: sources, biological effects and medical applications
Philip Taday, TeraView Limited
Date: February 23rd Time: 14:30 Location: Aula 1

 

 




Photonics west

22 - 27 January 2011 The Moscone Center San Francisco, California, USA


2010 MRS Fall Meeting
November 29-December 3, 2010
Hynes Convention Center | Sheraton Boston Hotel Boston, Massachusetts

Please visit us at the 2010 MRS Fall Meeting in Boston, Massachusets.


International Symposium for Testing and Failure Analysis (ISTFA)
14th - 18th November
Dallas, Texas. Booth 207

TeraView, working with Intel Corporation, has developed a next generation Terahertz (THz) Time Domain Reflectometry (TDR) type Failure Analysis (FA) tool to enable fast high resolution (sub 10 micron) fault isolation and analysis in advanced semiconductor packages (POP, flip Chip etc).

Come and see us at Booth 207 to learn more!


ASNT 19th Annual Research Symposium & Spring Conference
22 - 26 March 2010
Williamsburg, VA

Dr Phil Taday, TeraView Ltd will be presenting at the conference

Applications of terahertz pulsed technology in non-destructive testing

 


DPG Spring Meeting
21- 26 March 2010
Regensburg, Germany

For more information on this event please click here.